PEC Annual Report Abstracts on Metrology

On this page:

2003

2002

2001

2000

1999

1998

1997

1996

1995

1994

2003 PEC Annual Report

• Fabrication, Distortion, and Metrology of Shrink Fit Electrical Connections by P. Morrissey and J. Eischen
• Characterizing Scribing Behavior on Single Crystal Silicon and the Effect of High Pressure Phase Transformation by T. Randall and R.O. Scattergood
• Metrology Artifact Design by K. Folkert and T.A. Dow
• Ultraform 2D by A. Sohn, K. Garrad and T.A. Dow

2002 PEC Annual Report

• Fabrication, Distortion, and Metrology of Shrink Fit Electrical Connections by P. Morrissey and J. Eischen
• Lapping Plate Charging by D. Kametz, T.A. Dow and R.O. Scattergood
• Scribing Mechanics of Single Crystal Silicon by T. Randall and R. Scattergood

2001 PEC Annual Report

• The Polar Profilometer Polaris by A. Sohn and K. Garrard
• Lapping Plate Charging by D. Kametz, T.A. Dow and R.O. Scattergood
• Distortion of Thin Cylinders by P. Morrissey and J. Eischen

2000 PEC Annual Report

• Lapping Plate Charging by D.A. Kametz, J.M. Stevens and T.A. Dow
• Bend Effect Due to Mechanical Scribing by B.W. Austin and R.O. Scattergood
• Modeling Laser Scribing for Use as a Precision Shaping Technique by B.M. Love and J.W. Eischen
• Surface Metrology of Compliant Materials in Fluid by A. Sohn
• Design of the Polar Profilometer POLARIS by A. Sohn and K.P. Garrard
• POLARIS Control and Data Acquisition by K.P. Garrard and A. Sohn

1999 PEC Annual Report

• Scribing of Brittle Materials by B. Austin and R. Scattergood
• High Stiffness, Miniature Magnetoelastic Force Sensor by M. Long and T. Dow
• Alumina-Titanium Carbide Wafer Distortion by B. Love and J. Eischen
• Three-Dimensional Measurement Probe by by E. Marino, T. Dow and A. Sohn
• Channeling Effects During Focused Ion Beam Micromaching of Copper by J. Phillips, D. Griffis and P. Russell

1998 PEC Annual Report

• Diamond Indenter Shaping Using FIB by K. Jarausch and P. Russell
• High Stiffness, Miniature Magnetoelastic Force by M. Long and T. Dow
• Three-Dimensional Measurement Probe by E. Marino and T. Dow
• Developments in Focused Ion Beam Micromachining of Copper by J. Phillips and P. Russell

1997 PEC Annual Report

• Diamond Indenter Shaping Using FIB by K. Jarausch and P. Russell.
• Cascaded Stress Amplification Applied to Magnetoelastic Force Sensors by M. Long and T. Dow
• Mathematical Model of Machine Tool Geometry by D. Oyewole and T. Dow
• Developments in Focused Ion Beam Micromachining (FIBM), Geometrically Enhanced FIBM, and Chemically Enhanced FIBM by J. Phillips and P. Russell
• Atomic Force Microscopy Studies of Microstructure and Properties of Self-Assembled Monolayers by J. Santiago, J. Richards and P. Russell

1996 PEC Annual Report

• Correlation of Film Stress and the Mechanical Response of Au Thin Films by K. Jarausch, J. Houston and P. Russell
• Mathematical Model of Machine Tool Geometry by A. Oyewole and T. Dow
• Atomic Force Microscopy Studies of Microstructure and Properties of Self Assembled Monolayers by J. Richards and P. Russell
• Friction of Bearing Coatings by A. Santavy and R. Scattergood

1995 PEC Annual Report

• Silicon Structures for In-Situ Characterization of Atomic Force Microscope Probe Geometry by K. Jarausch, J. Richards, T. Stark and P. Russell
• Machine Tool Metrology by A. Oyewole, G. Moorefield II and T. Dow
• Tribology of Diamond-Like Carbon Films by A. Santavy and R. Scattergood
• Focused Ion Beam Micromachining (FIBM) and Chemically Enhanced FIBM of Permalloy by D. Thaus and P. Russell

1994 PEC Annual Report

• Stability of Silicon Atomic Force Microscope (AFM) Probes and Manipulation of MEMS Structures by K. Jarausch, S. Winder and P. Russell
• Characterization of Semiconductor Surfaces with the Near Field Scanning Optical Microscope by A. La Rosa, M. Paesler and H. Hallen
• Tribology of Diamond-Like Carbon by A. Santavy and R. Scattergood
• Modification of Microelectromechanical Systems (MEMS) Using a Focused Ion Beam by D. Thaus and P. Russell